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Number of Publications

10 Number of Publications

“Reliability aspects. of tunnel oxides under different Fowler—Nordheim stress conditions” Proceeding. of the 1991 International Conference on Microelectronics, Cairo, Egypt, PP. 304—307, Dec. 21—23.

1991
Abstract

“A new approach to current DLTS in enhancement—mode MOSFET’s: Application to SIMOX devices” roceedings of the IEEE International S0I Conference, Colorado, USA, pp. 98—99.

1991
Abstract

“Noise sources in silicon on insulator (SIMOX) structures” 5th Conference on the physics of electro-optic microstructures and microdevices, Heraklion, Greece.

1990
Abstract

“Analyse at optimisation des matériaux et des composants issue des filières SOI” Opération GCIS COUCHES MINCES 1989-1990.

1990
Abstract

“Low frequency noise spectroscopy in thin SIMOX MOS transistors” IEEE SOS/SOI Technology Workshop, USA.

1990
Abstract

“Non—homogenity effects and noise sources in SOI MOSFET’s” First Conference in NOISE in advanced microelectronic devices”, Grenoble, France.

1990
Abstract

“Performance and physical mechanisms in SIMOX transistors operated at very low temperature IEEE Trans. Electron Devices, vol. ED-37, pp. 1007—1019.

1990
Abstract

“Interface coupling effects in thin silicon on insulator MOSFET’s” 5th Conference on the physics of electro-optic microstructures and microdevices,Heraklion, Greece.

1990
Abstract

“Novel investigation of edge effects in SIMOX transistors” IEEE SOS/SOI Technology Conference, Stateline, Nevada, USA, pp. 35—36.

1989
Abstract

“Detailed charge pumping evaluation of SIMOX using gated P-I-N diodes” IEEE SOS/SOI Technology Conference, Stateline, Nevada, USA, pp. 148—149.

1989
Abstract