Staff Members - Benha University
“Novel investigation of edge effects in SIMOX transistors” IEEE SOS/SOI Technology Conference, Stateline, Nevada, USA, pp. 35—36.
• 1989
Publication Information
Authors
T. ELEWA, B. KLEVELAND, B. BOUKRISS, T. OUISSE, A. CHOVET and S. CRISTOLOVEANU
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publication.type
International
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