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“Detailed charge pumping evaluation of SIMOX using gated P-I-N diodes” IEEE SOS/SOI Technology Conference, Stateline, Nevada, USA, pp. 148—149.

• 1989
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Authors T. OUISSE T. ELEWA, S. CRISTOLOVEANU, H. HADDARA, G. BOREL and D. IOANNOU
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publication.type International
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