| publication name | “Low frequency noise spectroscopy in thin SIMOX MOS transistors” IEEE SOS/SOI Technology Workshop, USA. |
|---|---|
| Authors | T. ELEWA, B. BOUKRISS, A. CHOVET and S. CRISTOLOVEANU |
| year | 1990 |
| keywords | |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
Not Available