| publication name | “Novel technique for carrier lifetime measurement by ّ-MOSFET transients” Proceedings 1996 IEEE international SOI conference, Sanibel Island, FL, USA, Oct. , PP 160-161. |
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| Authors | S. Cristoloveanu, T. Elewa, D. Munteanu and A. Ionescu |
| year | 1996 |
| keywords | |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
Not Available