Staff Members - Benha University
“Novel technique for carrier lifetime measurement by ّ-MOSFET transients” Proceedings 1996 IEEE international SOI conference, Sanibel Island, FL, USA, Oct. , PP 160-161.
• 1996
Publication Information
Authors
S. Cristoloveanu, T. Elewa, D. Munteanu and A. Ionescu
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publication.type
International
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Abstract
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