| publication name | “Novel electrical characterisation of edge effects in SIMOX transistors” ESSDERC 89, Berlin, Germany, Springer-Verlag, pp. 751-754. |
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| Authors | T. ELEWA B. KLEVELAND, B. BOUKRISS, T. OUISSE, A. COHOVET, S. CRISTOLOVEANU and J. DAVIS |
| year | 1989 |
| keywords | |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
Not Available