Staff Members - Benha University
“Novel electrical characterisation of edge effects in SIMOX transistors” ESSDERC 89, Berlin, Germany, Springer-Verlag, pp. 751-754.
• 1989
Publication Information
Authors
T. ELEWA B. KLEVELAND, B. BOUKRISS, T. OUISSE, A. COHOVET, S. CRISTOLOVEANU and J. DAVIS
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publication.type
International
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