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Number of Publications

10 Number of Publications

“ Behaviour for contaminating particle in SF6-gas mixtures with space charge effect”, 8th International Middle-East Power Systems Conference, MEPCON’2001, Helwan University, Cairo, Egypt, PP. 1057-1062, December 29-31.

2001
Abstract

” Diagnosis of particle contamination in compressed gas-insulated switchgear”, 12th International Symposium on High Voltage Engineering, ISH 2001, Bangalore, India, PP. 417-420, 20-24 August.

2001
Abstract

” Electrical discharges and breakdown in compressed sulphur-hexafluoride gas”, 8th annual meeting IEEE Technical Exchange Meeting, KFUPM, Dhahran, K.S.A., PP.1-10, April 17-18.

2001
Abstract

” Insulation Integrity of GIS/GITL Systems and Management of Particle Contamination”, IEEE Electrical Insulation Magazine, Volume 16, Number 5, PP. 25-37, September/October.

2000
Abstract

“ Particle contamination factor and breakdown voltages for SF6-gas mixtures”, First Saudi Technical Conference and Exhibition (STCEX2000), Riyadh, Saudi Arabia, PP. 160-165, 18-22 November 2000.

2000
Abstract

” Optimum SF6-N2, SF6-Air, SF6-CO2 based on particle contamination”, Conference Record of the 2000 IEEE International Symposium on Electrical Insulation, Anaheim, California USA, PP. 292-295, April 2-5.

2000
Abstract

’’ Sensitivity of the dielectric strength for SF6-gas mixtures to particle contamination”, Seventh International Middle-East Power Systems Conference, MEPCON’2000, Ain Shams University, Cairo-Egypt, PP. 522-526, March.

2000
Abstract

Particle-Initiated Breakdown with Spacer Involvement in Compressed Gas and its Mixtures

1999 Conference on Electrical Insulation and Dielectric Phenomena 1999
Full Paper Abstract

” Particle-initiated breakdown with spacer involvement in compressed gas and its mixtures”, Conference of Electrical Insulation and Dielectric Phenomena, Austin, Texas, USA, PP. 354-358, October 17-21.

1999
Full Paper Abstract

"Influence of conducting particles on the breakdown voltages of SF6 - N2 mixture”, Eleventh International Symposium on High Voltage Engineering, Volume 3, Topic D, Paper No. 3.187 P3, London, U.K., PP. 187-192, August.

1999
Full Paper Abstract