Fault diagnosis expert system in small signal circuits comprising diodes and bipolar transistors: A novel technique
The 3rd International Conference on AI Applications, Cairo, Egypt, January 4-7, 1995 • 1995
معلومات البحث
المؤلفون
Raafat A. El-Kammar, T. M. Hassanein, Ahmed F. El-Shikh, A. M. El-Mahdi
الكلمات المفتاحية
Not Available
المجلة العلمية
The 3rd International Conference on AI Applications, Cairo, Egypt, January 4-7, 1995
الناشر
Not Available
المجلد
Not Available
العدد
Not Available
الصفحات
Not Available
publication.type
International
رابط البحث
Not Available
المواد المرفقة
Not Available
الملخص
The topic of fault diagnosis in circuit and systems has acquired great concern in the development of research. This paper presents a novel and intelligent model for fault diagnosis in small signal electric and electronic circuits comprising diodes and BJTs. The first step in this process is to analyse the circuit under test by subdividing it into nodes and branches and thereafter applying kirchoffs law for the currents at each node to generate a matrix capable of providing the direction of all currents in the circuit. The logical inference engine is then applied to the solid results obtained to induce accurately for the source of the fault or faults. This technique was applied to different circuits and proven to be successfully in (98%) of the cases at a very fast rate. A hybridization of both PROLOG and C language was used in erecting this system
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