| publication name | “Interface properties and recombination mechanisms in SIMOX structures” published in Physics and Technology of Amorphous Si02, Plenum Press (R.A.B. Devine Ed.), New York, pp. 553—556. |
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| Authors | T. ELEWA, H. HADDARA, and S. CRISTOLOVEANU |
| year | 1988 |
| keywords | |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
Not Available