| publication name | “Measurement and modeling of drain current DLTS in Enhancement SOI MOSFETS” Microelectronics Journal, vol 24, pp.647—657 |
|---|---|
| Authors | II. HADDARA, M. T. ELEWA, and S. CRISTOLOVEANU |
| year | 1993 |
| keywords | |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
Not Available