| publication name | “Integrated Asynchronous Regulation for Nanometric Technologies”, 1st European workshop on CMOS Variability (VARI), May 26-27, Montpellier, France, pp. 86-91. |
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| Authors | Hatem Zakaria, Sylvain Durand, Nicolas Marchand and Laurent Fesquet, |
| year | 2010 |
| keywords | |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
Not Available