| publication name | Application of Entropy Measures to a Failure Times of Electrical Components Models |
|---|---|
| Authors | Mervat Mahdy; Dina S. Eltelbany |
| year | 2017 |
| keywords | Nakagami- μ distribution; Selection models; Weighted distribution; Entropies measures |
| journal | |
| volume | Not Available |
| issue | Not Available |
| pages | Not Available |
| publisher | Not Available |
| Local/International | International |
| Paper Link | Not Available |
| Full paper | download |
| Supplementary materials | Not Available |
Abstract
It is worth mentioning that the distribution of Nakagami is a flexible life time model of distribution that could present a suitable fit to a number of failure data sets. The theory of reliability and reliability engineering as well made intensive usage of the distribution of Nakagami. Due to the less property of memory of such distribution, it is fit to model the portion "constant hazard rate" and used in the theory of reliability. Moreover, it is so acceptable as it is so simple to increase rates of failure in a model of reliability. As well, the distribution of Nakagami is considered the favorable distribution to ensure the electrical component reliability compared to the distribution of Weibull, Gamma and lognormal (many researchers studied it was in recent times, including (c.f. [Yacoub (1999), Cheng and Beaulieu (2001), Schwartz et al. (2013), Ahmad and Rehman (2015), Brychkov and Savischenko (2015), Ahmad et al. (2016), Gkpinar et al. (2016), Mudasir et al. (2016) and Kousar and Memon (2017).]) In addition, the idea of information-theoretic entropy was presented for the first time by Shannon (1948) and then by Weiner ( 1949) in Cybernetics. Through out the last 60 years, after Shannon (1948) had his entropy measure, a big number of papers, books and