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SIX-PORT REFLECTOMETER BASED ON FOUR 0°/180° MICROSTRIP RING COUPLERS

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS • 2004
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Publication Information
Authors Ashraf S. Mohra
Keywords Six-port reflectometer, reflection coefficient, Microstrip
Journal MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
Publisher Wiley Interscience
Volume 40
Issue 2
Pages 167-17
publication.type International
Paper Link Not Available
Supplementary Materials Not Available
Abstract
A six-port reflectometer is used to measure the reflection coeficient of the unknown devices. it can measure the magniyude and phase with repeatable measurements and some standards. A six-port reflectometer constructed from a 0°/180°
microstrip-ring coupler is presented. Three different constructions
are given with their optimum positions of the q-point. One of these
constructions is realized on an RT/Duroid 5880 at 3 GHz. Good
agreement with the measurements obtained using a vector network
analyzer is found.