Staff Members - Benha University
“Interface properties and recombination mechanisms in SIMOX structures” published in Physics and Technology of Amorphous Si02, Plenum Press (R.A.B. Devine Ed.), New York, pp. 553—556.
• 1988
Publication Information
Authors
T. ELEWA, H. HADDARA, and S. CRISTOLOVEANU
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publication.type
International
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