Towards the Evaluation of P(X(t) > Y (t)) when both X(t) and Y (t) are inactivity times of two systems
COMMUNICATIONS IN STATISTICS—THEORY AND METHODS • 2017
معلومات البحث
المؤلفون
Mohamed Sewalim Hamed
الكلمات المفتاحية
Bias sampling; mean
inactivity time; reliability;
reliability ordering; reversed
hazard rate; U-statistics.
المجلة العلمية
COMMUNICATIONS IN STATISTICS—THEORY AND METHODS
الناشر
COMMUNICATIONS IN STATISTICS—THEORY AND METHODS
المجلد
Not Available
العدد
Not Available
الصفحات
1-7
publication.type
International
رابط البحث
Open Link
المواد المرفقة
Not Available
الملخص
The inactivity time, also known as reversed residual life, has been a
topic of increasing interest in the literature. In this investigation, based
on the comparison of inactivity times of two devices, we introduce
and study a new estimate of the probability of the inactivity time of
one device exceeding that of another device. The problem studied in
this paper is important for engineers and system designers. It would
enable them to compare the inactivity times of the products and,
hence to design better products. Several properties of this probability
are established. Connections between the target probability and the
reversed hazard rates of the two devices are established. In addition,
some of the reliability properties of the new concept are investigated
extending the well-known probability ordering. Finally, to illustrate the
introduced concepts, many examples and applications in the context
of reliability theory are included
topic of increasing interest in the literature. In this investigation, based
on the comparison of inactivity times of two devices, we introduce
and study a new estimate of the probability of the inactivity time of
one device exceeding that of another device. The problem studied in
this paper is important for engineers and system designers. It would
enable them to compare the inactivity times of the products and,
hence to design better products. Several properties of this probability
are established. Connections between the target probability and the
reversed hazard rates of the two devices are established. In addition,
some of the reliability properties of the new concept are investigated
extending the well-known probability ordering. Finally, to illustrate the
introduced concepts, many examples and applications in the context
of reliability theory are included
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