Application of Entropy Measures to a Failure Times of Electrical Components Models
• 2017
معلومات البحث
المؤلفون
Mervat Mahdy; Dina S. Eltelbany
الكلمات المفتاحية
Nakagami- μ distribution; Selection models; Weighted distribution;
Entropies measures
المجلة العلمية
Not Available
الناشر
Not Available
المجلد
Not Available
العدد
Not Available
الصفحات
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publication.type
International
رابط البحث
Not Available
المواد المرفقة
Not Available
الملخص
It is worth mentioning that the distribution of Nakagami is a flexible life time model of
distribution that could present a suitable fit to a number of failure data sets. The theory of
reliability and reliability engineering as well made intensive usage of the distribution of
Nakagami. Due to the less property of memory of such distribution, it is fit to model the
portion "constant hazard rate" and used in the theory of reliability. Moreover, it is so
acceptable as it is so simple to increase rates of failure in a model of reliability. As well,
the distribution of Nakagami is considered the favorable distribution to ensure the
electrical component reliability compared to the distribution of Weibull, Gamma and
lognormal (many researchers studied it was in recent times, including (c.f. [Yacoub
(1999), Cheng and Beaulieu (2001), Schwartz et al. (2013), Ahmad and Rehman (2015),
Brychkov and Savischenko (2015), Ahmad et al. (2016), Gkpinar et al. (2016), Mudasir
et al. (2016) and Kousar and Memon (2017).])
In addition, the idea of information-theoretic entropy was presented for the first time by
Shannon (1948) and then by Weiner ( 1949) in Cybernetics. Through out the last 60
years, after Shannon (1948) had his entropy measure, a big number of papers, books and
distribution that could present a suitable fit to a number of failure data sets. The theory of
reliability and reliability engineering as well made intensive usage of the distribution of
Nakagami. Due to the less property of memory of such distribution, it is fit to model the
portion "constant hazard rate" and used in the theory of reliability. Moreover, it is so
acceptable as it is so simple to increase rates of failure in a model of reliability. As well,
the distribution of Nakagami is considered the favorable distribution to ensure the
electrical component reliability compared to the distribution of Weibull, Gamma and
lognormal (many researchers studied it was in recent times, including (c.f. [Yacoub
(1999), Cheng and Beaulieu (2001), Schwartz et al. (2013), Ahmad and Rehman (2015),
Brychkov and Savischenko (2015), Ahmad et al. (2016), Gkpinar et al. (2016), Mudasir
et al. (2016) and Kousar and Memon (2017).])
In addition, the idea of information-theoretic entropy was presented for the first time by
Shannon (1948) and then by Weiner ( 1949) in Cybernetics. Through out the last 60
years, after Shannon (1948) had his entropy measure, a big number of papers, books and
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